Gold-Plated DFN10 Burn-in & Aging Test Socket with Heat Sink (3x3mm, 0.5mm Pitch)

This advanced test socket is designed for reliable burn-in and aging testing of devices with a DFN10 package. Featuring a gold plating, it ensures excellent conductivity and durability. The integrated heat sink efficiently dissipates heat, maintaining optimal operating temperatures. With a compact 3x3mm size and 0.5mm pitch, it is perfect for precise and efficient testing in high-performance applications. This socket provides a robust and efficient solution for evaluating and extending the lifespan of semiconductor devices. Part Number: DFN10 Model: DFN10 Manufacture country: China Instructions included: No